Voltage Collapse Prediction of IEEE 30-Bus system. Tikrit Journal of Engineering Sciences, [S. l.], v. 28, n. 1, p. 98–112, 2021. DOI: 10.25130/tjes.28.1.10. Disponível em: https://tj-es.com/ojs/index.php/tjes/article/view/182.. Acesso em: 10 sep. 2026.